Methods and techniques used by the AK Steinem

If you are interested in using one of the below-listed methods, please contact Prof. Dr. Claudia Steinem.

Fluorescence microscopy

Fluoreszenzmikroskopie


  • Epifluorescence microscopy

  • Confocal laser scanning microscopy
    (405-635 nm excitation, temperature controlled (0 to 60°C), FRET, FRAP)

  • Spinning disc confocal microscopy
    (405-639 nm excitation, EMCCD with single-photon detection at < 10 ms time resolution)


  • Scanning probe microscopy

    Rastersondenmikroskopie

  • Atomic force microscopy
    (can be combined with fluorescence microscopy)

  • Scanning ion conductance microscopy
    (non-invasive topographical and electrochemical surface analysis)


  • Film thickness and adsorption measurements

    Adsorptionsstudien

  • Reflectometric interference spectroscopy
    (optical thickness measurements using a white light source)

  • Surface plasmon resonance spectroscopy
    (optical waveguide spectroscopy possible)


  • Electrochemistry

    Elektrochemie

  • Single channel measurements (planar patch clamp)
    (solvent-free and solvent-containing self-supported membranes, several parallel measurements, array scan)

  • Electrical impedance spectroscopy


  • Spectroscopy

    Spektroskopie

  • UV-Vis spectroscopy

  • Fluorescence spectroscopy

  • FT-IR spectroscopy
    (ATR, PM-IRRAS, VCD, measurements on solids, liquids, and temperature controlled biological samples, diffuse reflectance on solids and powders)


  • Surface preparation techniques

    Evaporation unit

  • High vacuum coating system UNIVEX400

  • Sputter coater

  • Etching of porous aluminium oxide

  • Plasma cleaner


  • Protein biochemical methods

  • Cell culture (S1)

  • Protein expression, -purification and -analysis


  • Membrane model systems

  • Small, large, and giant unilamellar vesicles (SUVs, LUVs, GUVs)

  • Pore spanning membranes

  • Solid supported membranes

  • Lipid monolayers







Images courtesy of: A. Bartsch, B. Gerdes, M. Gleisner, T. Oswald, C. Reinermann