Methods and techniques used by the AK Steinem
If you are interested in using one of the below-listed methods, please contact Prof. Dr. Claudia Steinem.
Fluorescence microscopy
- Epifluorescence microscopy
- Confocal laser scanning microscopy
(405-635 nm excitation, temperature controlled (0 to 60°C), FRET, FRAP) - Spinning disc confocal microscopy
(405-639 nm excitation, EMCCD with single-photon detection at < 10 ms time resolution) - Atomic force microscopy
(can be combined with fluorescence microscopy) - Scanning ion conductance microscopy
(non-invasive topographical and electrochemical surface analysis) - Reflectometric interference spectroscopy
(optical thickness measurements using a white light source) - Surface plasmon resonance spectroscopy
(optical waveguide spectroscopy possible) - Single channel measurements (planar patch clamp)
(solvent-free and solvent-containing self-supported membranes, several parallel measurements, array scan) - Electrical impedance spectroscopy
- UV-Vis spectroscopy
- Fluorescence spectroscopy
- FT-IR spectroscopy
(ATR, PM-IRRAS, VCD, measurements on solids, liquids, and temperature controlled biological samples, diffuse reflectance on solids and powders) - High vacuum coating system UNIVEX400
- Sputter coater
- Etching of porous aluminium oxide
- Plasma cleaner
- Cell culture (S1)
- Protein expression, -purification and -analysis
- Small, large, and giant unilamellar vesicles (SUVs, LUVs, GUVs)
- Pore spanning membranes
- Solid supported membranes
- Lipid monolayers
Scanning probe microscopy
![Rastersondenmikroskopie](/storage/pictures/734307430ead9b1e96ba28ade475dc44.jpg)
Film thickness and adsorption measurements
![Adsorptionsstudien](/storage/pictures/613f909da80f5a0242c1004c01c10adb.jpg)
Electrochemistry
![Elektrochemie](/storage/pictures/4df315809208ff4f24f1656469333377.jpg)
Spectroscopy
![Spektroskopie](/storage/pictures/60e960c013aa98bec24a3d5fb1d2fa19.jpg)
Surface preparation techniques
![Evaporation unit](/storage/pictures/156387.jpg)
Protein biochemical methods
Membrane model systems
Images courtesy of: A. Bartsch, B. Gerdes, M. Gleisner, T. Oswald, C. Reinermann