Collaborative Laboratory and User Facility for Electron Microscopy

Equipment (Euro / hour) Internel User and Collaborators Service for non-profit organisations* Service for Industry*
Titan 80-300 E-TEM 120 200 300
Titan Krios G4 10 Upon request Upon request
Aquilos 2 5 Upon request Upon request
Nova NanoSEM40 80 120
Kratos AXIS Supra XPS30 60 90
e-line4080 120
Helios G4 Dual Beam 80 140 200
NovaNanoLAB80 140 200
FEI/Philips CM-30 80 140 200
FEI/Philips CM-20 80 140 200
*All prices are net prices and subject to value added tax at the prevailing rate.

  • Bright and dark field imaging
  • High resolution imaging
  • Selected area diffraction, nanodiffraction and CBED
  • Hollow cone illumination
  • high resolution STEM imaging
  • Energy disoersive X-Ray elemental analysis (EDX)
  • Energy filtered TEM

  • quantitative elemental analysis
  • All mentioned above techniques are available at the pressures up to 20mbar for various gases: Ar, N2, CO, CO2, H2, O2, H2O and their mixtures (H2 up to 6mbar).
  • TEM and STEM high-resolution image simulation

  • Low backgrownd double-tilt analytical holders
  • Single-tilt holders
  • 360 rotational specimen holder
  • STM holder for in-situ electrical measurements
  • STM holder for in-situ electrical measurements with optical stimulation
  • Holder for in-situ mechanical stress tests
  • Single-tilt N2 cooling holder (up to -178C)
  • Single-tilt heating holder (up to +1000C)

  • SE (imaging with secondary electrons)
  • low voltage imaging
  • surface morphology
  • BSE (imaging with back scattered electrons)
  • material contrast
  • topography
  • qualitative elemental analysis
  • quantitative elemental analysis
  • orientational analysis (EBSD)
  • Micromanipulation (Omniprobe and Kleindek)

  • Patterning
  • TEM specimen preparation

  • Diamond wheel saw
  • Ultrasonic disk cutter
  • Grinding and polishing machine
  • Dimple grinder
  • Precision Ion Polishing System Gatan PIPS 691 with liquid N2 cooling